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Japan Electronics JSM-7500F Cold Field Emission Scanning Electron Microscope
Japan Electronics JSM-7500F Cold Field Emission Scanning Electron Microscope
Product details
The JSM-7500F field emission scanning mirror is equipped with a cold field emission electron gun and a semi in lens objective, which, when combined with Gentle Beam (GB mode or soft beam), can achieve extremely high resolution. By combining with the GB mode, high resolution can be achieved even with incident electron beams of several hundred electron volts, making it one of the most suitable devices for observing shallow surfaces of samples. In addition, JSM-7500F can also be equipped with various accessories for elemental analysis and other purposes.
The perfect combination of powerful versatility and the highest resolution
The electron optical system of JSM-7500F field emission scanning electron microscope combines a field emission electron gun and a semi in lens objective. The cold field emission electron gun can focus the electron beam very finely even at low acceleration voltage, and like a general-purpose scanning electron microscope, it can also observe large samples with high resolution.
Gentle Beam can observe shallow surfaces of samples with extremely low-energy incident electron beams
By applying a bias voltage to the sample and irradiating it with an electron beam, the Gentle Beam mode (soft beam) with higher resolution than the general mode can be used to observe the shallow surface of the sample at high resolution with incident electrons of several hundred electron volts, which has not been achieved so far..
New R-filter for selective detection of secondary electrons and backscattered electrons
The new R-filter has four modes: standard SB (secondary electron detection) mode, standard BE mode (backscattered electron detection), Sb mode (secondary electron dominant), and Bs mode (backscattered electron dominant). The Sb mode can detect secondary electrons mixed with any proportion of backscattered electrons, and the Bs mode can detect backscattered electrons mixed with any proportion of secondary electrons. These functions can be completed with one click on a concise and easy to understand menu.
The perfect combination of powerful versatility and the highest resolution
The electron optical system of JSM-7500F field emission scanning electron microscope combines a field emission electron gun and a semi in lens objective. The cold field emission electron gun can focus the electron beam very finely even at low acceleration voltage, and like a general-purpose scanning electron microscope, it can also observe large samples with high resolution.
Gentle Beam can observe shallow surfaces of samples with extremely low-energy incident electron beams
By applying a bias voltage to the sample and irradiating it with an electron beam, the Gentle Beam mode (soft beam) with higher resolution than the general mode can be used to observe the shallow surface of the sample at high resolution with incident electrons of several hundred electron volts, which has not been achieved so far..
New R-filter for selective detection of secondary electrons and backscattered electrons
The new R-filter has four modes: standard SB (secondary electron detection) mode, standard BE mode (backscattered electron detection), Sb mode (secondary electron dominant), and Bs mode (backscattered electron dominant). The Sb mode can detect secondary electrons mixed with any proportion of backscattered electrons, and the Bs mode can detect backscattered electrons mixed with any proportion of secondary electrons. These functions can be completed with one click on a concise and easy to understand menu.
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